Надежность полупроводниковых устройств : [Сборник статей] / Пер. с англ. Под общ. ред. А. А. Маслова.

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Material type: Text

TextLanguage: Russian Original language: English Publication details: Москва : Изд-во иностр. лит., 1963.Description: 426 с. илSubject(s):

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Holdings
Item type	Current library	Call number	Copy number	Status	Date due	Barcode
წიგნი	ეროვნული სამეცნიერო ბიბლიოთეკა 2 კორპ. 2, საცავი	621.382 (Browse shelf(Opens below))	ს-5404	Available		2017-21900

Доп. тит. л.: Semiconductor reliability. Ed. by John E. Shwop, Harold J. Sullivan. Elizabeth, Engineering publ., 1961 RuMoRGB

Библиогр. в конце статей.

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