Secondary ion mass spectrometry. SIMS IV : proceedings of the fourth International Conference, Osaka, Japan, November 13 - 19, 1983 Ed. : A. Benninghoven ...

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Material type: Text

TextLanguage: English Series: Springer series in chemical physics / Springer series in chemical physics ; 36Publication details: Berlin [u.a.] : Springer, 1984.Description: XV, 503 S. : Ill., graph. DarstISBN:

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Item type	Current library	Call number	Copy number	Status	Date due	Barcode
წიგნი	ეროვნული სამეცნიერო ბიბლიოთეკა 1 საცავი. 1 კორპ.	541.1 (Browse shelf(Opens below))	2E39863	Available		2011-1276

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