The changing philosophy of test : International Test Conference, 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC / IEEE Computer Society. IEEE Computer Society. Philadelphia Chapter.

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Material type: Text

TextLanguage: English Los Alamitos, Calif. : IEEE Computer Society Press, 1990Description: xvi, 1083 pISBN:

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Item type	Current library	Call number	Copy number	Status	Date due	Barcode
წიგნი	ეროვნული სამეცნიერო ბიბლიოთეკა 1 საცავი. 1 კორპ.	004 (Browse shelf(Opens below))	3E18348	შესამოწმებელია		2018-4079929773

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