X-ray microscopy : proceedings of the international symposium, Göttingen, Fed. Rep. of Germany, September 14-16, 1983 / editors G. Schmahl and D. Rudolph.

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Material type: Text

TextLanguage: English Series: Springer series in optical sciences ; v. 43Berlin ; New York : Springer-Verlag, 1984Description: ix, 345 p. : ill. (some color) ; 24 cmISBN:

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List(s) this item appears in: Springer series

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Item type	Current library	Call number	Copy number	Status	Date due	Barcode
წიგნი	ეროვნული სამეცნიერო ბიბლიოთეკა 1 საცავი. 1 კორპ.	535+524.2-735 (Browse shelf(Opens below))	2E39838	Available		2016-8009

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