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Polycristalline Semiconductors : Physical Properties and Applications : Proceedings of the International School of Materials Science and Technology at the Ettore Majorana Centre, Erice,Italy, July 1-15, 1984 / Editor G. Harbeke.

Contributor(s): Material type: TextTextLanguage: English Series: Springer series in solid-state sciences ; 57Berlin : Springer, 1985Description: viii, 245 p. ; 24 cmISBN:
  • 3540151435
  • 9783540151432
Subject(s):
Contents:
I Fundamental Aspects of Grain Boundaries.- Atomic Structure of Grain Boundaries. (With 5 Figures).- Computer Calculations of Grain Boundary Energies in Germanium and Silicon. (With 4 Figures).- The Geometrical Character of Extended Interfacial Defects in Semiconducting Materials. (With 12 Figures).- Grain Boundary Segregation. Grain Boundary Diffusion. (With 22 Figures).- II Electronic Characterization of Grain Boundaries.- Electronic Properties of Grain Boundaries. (With 15 Figures).- Electronic States at Grain Boundaries in Semiconductors. (With 15 Figures).- Electrical Properties of Grain Boundaries in the Presence of Deep Bulk Traps. (With 7 Figures).- Beam Induced Current Characterization in Polycrystalline Semiconductors. (With 17 Figures).- III Properties and Applications of Polycrystalline Silicon.- Optical Properties of Polycrystalline Silicon Films. (With 10 Figures).- Polycrystalline Silicon in Integrated Circuits. (With 13 Figures).- IV Applications of Polycrystalline Semiconductor Compounds.- Electroluminescence in Polycrystalline Semiconductors. (With 21 Figures).- The Electrical Properties of Oxides Under Conditions of Oxidation, Reduction and Catalysis.- Evolution of Physical Models for ZnO-Varistors - A Review. (With 18 Figures).- Index of Contributors.
List(s) this item appears in: Springer series
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წიგნი წიგნი ეროვნული სამეცნიერო ბიბლიოთეკა 1 საცავი. 1 კორპ. 53 (Browse shelf(Opens below)) 2E41087 Available 2016-8550

I Fundamental Aspects of Grain Boundaries.- Atomic Structure of Grain Boundaries. (With 5 Figures).- Computer Calculations of Grain Boundary Energies in Germanium and Silicon. (With 4 Figures).- The Geometrical Character of Extended Interfacial Defects in Semiconducting Materials. (With 12 Figures).- Grain Boundary Segregation. Grain Boundary Diffusion. (With 22 Figures).- II Electronic Characterization of Grain Boundaries.- Electronic Properties of Grain Boundaries. (With 15 Figures).- Electronic States at Grain Boundaries in Semiconductors. (With 15 Figures).- Electrical Properties of Grain Boundaries in the Presence of Deep Bulk Traps. (With 7 Figures).- Beam Induced Current Characterization in Polycrystalline Semiconductors. (With 17 Figures).- III Properties and Applications of Polycrystalline Silicon.- Optical Properties of Polycrystalline Silicon Films. (With 10 Figures).- Polycrystalline Silicon in Integrated Circuits. (With 13 Figures).- IV Applications of Polycrystalline Semiconductor Compounds.- Electroluminescence in Polycrystalline Semiconductors. (With 21 Figures).- The Electrical Properties of Oxides Under Conditions of Oxidation, Reduction and Catalysis.- Evolution of Physical Models for ZnO-Varistors - A Review. (With 18 Figures).- Index of Contributors.

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