TY  - BOOK
AU  - Rudolph,Matthias
AU  - Fager,Christian
AU  - Root,David E.
TI  - Nonlinear transistor model parameter extraction techniques
T2  - The Cambridge RF and microwave engineering series
SN  - 9781139014960 (ebook)
AV  - TK7871.9 .N66 2012
U1  - 621.3815/28 23
PY  - 2012///
CY  - Cambridge
PB  - Cambridge University Press
KW  - Transistors
KW  - Mathematical models
KW  - Electronic circuit design
N1  - Title from publisher's bibliographic system (viewed on 05 Oct 2015)
N2  - Achieve accurate and reliable parameter extraction using this complete survey of state-of-the-art techniques and methods. A team of experts from industry and academia provides you with insights into a range of key topics, including parasitics, intrinsic extraction, statistics, extraction uncertainty, nonlinear and DC parameters, self-heating and traps, noise, and package effects. Learn how similar approaches to parameter extraction can be applied to different technologies. A variety of real-world industrial examples and measurement results show you how the theories and methods presented can be used in practice. Whether you use transistor models for evaluation of device processing and you need to understand the methods behind the models you use, or you want to develop models for existing and new device types, this is your complete guide to parameter extraction
UR  - https://doi.org/10.1017/CBO9781139014960
ER  -