Applied survival analysis : regression modeling of time to event data / David W. Hosmer, Jr., Stanley Lemeshow.

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Material type: Text

TextLanguage: English Series: Publication details: New York : John Wiley & Sons, c1999.Description: xiii, 386 p. : ill. ; 25 cmISBN:

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Holdings
Item type	Current library	Call number	Copy number	Status	Date due	Barcode
წიგნი	ეროვნული სამეცნიერო ბიბლიოთეკა 1	614.4+311:57 (Browse shelf(Opens below))	2E60150	Available		2010-612518

Includes bibliographical references (p. 365-377) and index.

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