Characterization and production monitoring of sputtered thin films for optical applications / Mikael Georgson.
Material type:![Text](/opac-tmpl/lib/famfamfam/BK.png)
- 9155426336
- 013.378485
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ეროვნული სამეცნიერო ბიბლიოთეკა 1 საცავი. 1 კორპ. | 539.2(043) (Browse shelf(Opens below)) | 3E16412 | შესამოწმებელია | 2021-2840 |
Zugl.: Uppsala, Univ., Diss., 1990.
Includes bibliographies.
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