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Secondary ion mass spectrometry (SIMS) : ... : proceedings of the ... International Conference on Secondary Ion Mass Spectrometry (SIMS ...). Vol. 2.

By: Material type: TextTextLanguage: English Series: Springer series in chemical physics ; v. 9 | Springer series in chemical physicsPublication details: Berlin ; New York : Springer-Verlag 1979.Description: XIII, 298 S. : 234 Ill. u. graph. DarstOther title:
  • SIMS
Subject(s): Additional physical formats: Online version:: Secondary ion mass spectrometryDDC classification:
  • 543/.0873 19
LOC classification:
  • QD96.S43 I58a
Continues: Workshop on Secondary Ion Mass Spectrometry and Ion Microprobe Mass Analysis. Secondary ion mass spectrometry
List(s) this item appears in: Springer series
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Item type Current library Call number Copy number Status Date due Barcode
წიგნი წიგნი ეროვნული სამეცნიერო ბიბლიოთეკა 1 საცავი. 1 კორპ. 544 (Browse shelf(Opens below)) 2E37889 Available 2016-7847

Published: Chichester ; New York : Wiley, c1988-

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