Secondary ion mass spectrometry (SIMS) : ... : proceedings of the ... International Conference on Secondary Ion Mass Spectrometry (SIMS ...). Vol. 2.
Material type: TextLanguage: English Series: Springer series in chemical physics ; v. 9 | Springer series in chemical physicsPublication details: Berlin ; New York : Springer-Verlag 1979.Description: XIII, 298 S. : 234 Ill. u. graph. DarstOther title:- SIMS
- 543/.0873 19
- QD96.S43 I58a
Item type | Current library | Call number | Copy number | Status | Date due | Barcode | |
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წიგნი | ეროვნული სამეცნიერო ბიბლიოთეკა 1 საცავი. 1 კორპ. | 544 (Browse shelf(Opens below)) | 2E37889 | Available | 2016-7847 |
Published: Chichester ; New York : Wiley, c1988-
SERBIB/SERLOC merged record
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