Electrically based microstructural characterization II :
Electrically based microstructural characterization II : symposium held December 1-4, 1997, Boston, Massachusetts, U.S.A. /
Electrically based microstructural characterization 2 Electrically based microstructural characterization two
editors, Rosario A. Gerhardt, Mohammad A. Alim, S. Ray Taylor.
- Materials Research Society, c1998.
- xi, 367 p. : ill. ; 24 cm.
- (Materials Research Society symposium proceedings ; v. 500) .
Includes bibliographical references and indexes.
155899405X
98045671
Materials--Microscopy--Congresses.
Microstructure--Congresses.
მიკროსტრუქტურა მასალები
TA417.23 / .E416 1998
620.1/1299
620.22
Includes bibliographical references and indexes.
155899405X
98045671
Materials--Microscopy--Congresses.
Microstructure--Congresses.
მიკროსტრუქტურა მასალები
TA417.23 / .E416 1998
620.1/1299
620.22