MARC details
000 -LEADER |
fixed length control field |
01382nam a22003257a 4500 |
001 - CONTROL NUMBER |
control field |
2616333 |
003 - CONTROL NUMBER IDENTIFIER |
control field |
Ge_NSL |
005 - DATE AND TIME OF LATEST TRANSACTION |
control field |
20230907081940.0 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
fixed length control field |
980724s1998 paua b 101 0 eng |
010 ## - LIBRARY OF CONGRESS CONTROL NUMBER |
LC control number |
98033841 |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
1558993959 |
040 ## - CATALOGING SOURCE |
Original cataloging agency |
DLC |
Transcribing agency |
DLC |
Modifying agency |
DLC |
050 00 - LIBRARY OF CONGRESS CALL NUMBER |
Classification number |
TK7871.85 |
Item number |
.S46697 1998 |
080 ## - UNIVERSAL DECIMAL CLASSIFICATION NUMBER |
Universal Decimal Classification number |
621.38(063) |
082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER |
Classification number |
621.3815/2/015118 |
Edition number |
21 |
245 00 - TITLE STATEMENT |
Title |
Semiconductor process and device performance modeling : |
Remainder of title |
symposium held December 2-3, 1997, Boston, Massachusetts, U.S.A. / |
Statement of responsibility, etc |
editors, Scott T. Dunham, Jeffrey S. Nelson. |
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
Place of publication, distribution, etc |
Warrendale, Pa. : |
Name of publisher, distributor, etc |
Materials Research Society, |
Date of publication, distribution, etc |
c1998. |
300 ## - PHYSICAL DESCRIPTION |
Extent |
ix, 273 p. : |
Other physical details |
ill. ; |
Dimensions |
24 cm. |
490 1# - SERIES STATEMENT |
Series statement |
Materials Research Society symposium proceedings, |
International Standard Serial Number |
0272-9172 ; |
Volume number/sequential designation |
v. 490 |
504 ## - BIBLIOGRAPHY, ETC. NOTE |
Bibliography, etc |
Includes bibliographical references and indexes. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Semiconductors |
General subdivision |
Mathematical models |
-- |
Congresses. |
9 (RLIN) |
8499 |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Semiconductors |
General subdivision |
Defects |
-- |
Congresses. |
9 (RLIN) |
8500 |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Solid state physics |
General subdivision |
Congresses. |
9 (RLIN) |
8501 |
700 1# - ADDED ENTRY--PERSONAL NAME |
Personal name |
Dunham, S. T. |
Fuller form of name |
(Scott T.) |
9 (RLIN) |
8502 |
700 1# - ADDED ENTRY--PERSONAL NAME |
Personal name |
Nelson, Jeffrey S. |
Fuller form of name |
(Jeffrey Steven) |
9 (RLIN) |
8503 |
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE |
Uniform title |
Materials Research Society symposia proceedings ; |
Volume number/sequential designation |
v. 490. |
9 (RLIN) |
8504 |
906 ## - LOCAL DATA ELEMENT F, LDF (RLIN) |
a |
7 |
b |
cbu |
c |
orignew |
d |
1 |
e |
ocip |
f |
19 |
g |
y-gencatlg |
942 ## - ADDED ENTRY ELEMENTS (KOHA) |
Source of classification or shelving scheme |
Dewey Decimal Classification |
Koha item type |
წიგნი |