National Science Library of Georgia

Electronic packaging materials science X : (Record no. 3100)

MARC details
000 -LEADER
fixed length control field 05660nam a22003497a 4500
001 - CONTROL NUMBER
control field 2186998
003 - CONTROL NUMBER IDENTIFIER
control field Ge_NSL
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20200814154810.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 101027t us ||||| |||| 00| 0 eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 1558994211
040 ## - CATALOGING SOURCE
Original cataloging agency LHL
Transcribing agency LHL
Modifying agency OrLoB-B
041 ## - LANGUAGE CODE
Language code of text/sound track or separate title eng
080 ## - UNIVERSAL DECIMAL CLASSIFICATION NUMBER
Universal Decimal Classification number 620.22(063)
245 00 - TITLE STATEMENT
Title Electronic packaging materials science X :
Remainder of title symposium held April 14-16, 1998, San Francisco, California, U.S.A. /
Statement of responsibility, etc editors, Daniel J. Belton ... [et al.].
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication, distribution, etc Warrendale, Pennsylvania. :
Name of publisher, distributor, etc Materials Research Society,
Date of publication, distribution, etc c1998.
300 ## - PHYSICAL DESCRIPTION
Extent ix, 262 p. :
Other physical details ill. ;
Dimensions 24 cm.
490 1# - SERIES STATEMENT
სერიის ცნობა Materials Research Society symposium proceedings ;
Volume number/sequential designation v. 515
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc Includes bibliographic references and indexes.
505 00 - FORMATTED CONTENTS NOTE
Title Efficient Interfacial Design - A Multidisciplinary View /
Statement of responsibility C. F. Shih, W. T. Chen and B. Cotterell [et al.] --
Title Experimental Investigation of Interfacial Adhesion in Microelectronic Assemblies /
Statement of responsibility Xiang Dal, Mark V. Brillhart and Paul S. Ho --
Title Molecular Modelling as a Tool for Adhesive Performance Understanding /
Statement of responsibility N. Iwamoto, J. Pedigo and A. Grieve [et al.] --
Title A Combined Analysis of Moisture Diffusion with Interface Fracture Mechanics on the Interface Delamination in the Plastic IC Packages During Reflow Soldering /
Statement of responsibility Y. B. Park and Jin Yu --
Title Adhesion and Subcritical Debonding of Polymer Interfaces for Microelectronic Packaging /
Statement of responsibility J. M. Snodgrass, G. Hotchkiss and R. H. Dauskardt --
Title Analysis of Catastrophic Field Failures Due to Conductive Anodic Filament (CAF) Formation /
Statement of responsibility W. J. Ready, B. A. Smith and L. J. Turbini [et al.] --
Title The Effects of Interfaces on C-4 Solder Bump Reliability /
Statement of responsibility Michael J. Sullivan --
505 80 - FORMATTED CONTENTS NOTE
Title The Study on the Under Bump Metallurgy (UBM) and 63SN-37PB Solder Bumps Interface for Flip-Chip Interconnection /
Statement of responsibility Se-Young Jang and Kyung-Wook Paik --
Title Under Bump Metallization Development for Eutectic Pb-Sn Solders /
Statement of responsibility S. J. Hong, T. M. Korhonen and M. A. Korhonen [et al.] --
Title Flip-Chip Metallurgies for Lead-Free Solders /
Statement of responsibility T. M. Korhonen, S. J. Hong and M. A. Korhonen [et al.] --
Title Maskless, Direct Deposition of Copper onto Aluminum Bond Pads for Flip-Chip Applications /
Statement of responsibility M. Fang, T. O'Keefe and M. Stroder [et al.] --
Title Alloy Joints for High-Temperature Electronic Packaging /
Statement of responsibility William W. So and Chin C. Lee --
Title Direct Measurements of Thermal Stress Distributions in Large Die Bonds for Power Electronics /
Statement of responsibility Jun He, M. C. Shaw and N. Sridhar [et al.] --
Title Damage Evolution and Mechanical Failure in Flip-Chip Interconnects /
Statement of responsibility A. Soper, I. De Wolf and G. Pozza [et al.] --
Title On the Shear Strength and Mixed-Mode Fracture Toughness of a Lead-Tin and a Tin-Silver Solder /
Statement of responsibility M. Manoharan, K. S. Siow and M. W. Weiser --
505 80 - FORMATTED CONTENTS NOTE
Title Underflow Process for Direct-Chip-Attachment Packaging /
Statement of responsibility P. C. Li, G. L. Lehmann and J. Cascio [et al.] --
Title Evaluation of Potential Printed Wiring Board Materials: Thermoplastic Polyimide + Polymer Liquid Crystal Blends /
Statement of responsibility Witold Brostow, Nandika Anne D'Souza and Bhaskar Gopalanarayanan [et al.] --
Title High-Density, High-Thermal Dissipation Substrates Fabricated Using a Conductive Composite Material /
Statement of responsibility Lutz Brandt, Goran Matijasevic and Pradeep Gandhi [et al.] --
Title Novel, Matched CTE Integrated Substrates for Power Electronics /
Statement of responsibility W. Kowbel, X. Xia and C. Bruce [et al.] --
Title Thermomechanical Stresses in Laminated Polymer Films on Silicon Substrates /
Statement of responsibility Jin S. Kim, Kyung W. Paik and Seung H. Oh [et al.] --
Title Electroplating of Gold-Tin Solder for Optoelectronic Applications /
Statement of responsibility Wenzhen Sun and Douglas G. Ivey --
Title A Study of Solder Paste Rheology for the Alternative Assembly and Reflow Technology (AART) Process /
Statement of responsibility S. T. Murthy, D. Manessis and K. Srihari [et al.] --
505 80 - FORMATTED CONTENTS NOTE
Title Whole-Field Displacement Measurement Techniques for Thermal Deformation Analyses of Electronic Packages /
Statement of responsibility Bongtae Han --
Title Reliability and Lifing Methodologies for Microelectronic Systems /
Statement of responsibility Ken Reifsnider --
Title Stress Evolution During Thermoset Cure /
Statement of responsibility Yuhai Mei, Albert F. Yee and Alan S. Wineman [et al.] --
Title On the Influence of Titanium Alloy Composition and Layer Thickness on the Mechanical Properties of a Polyimide Substrate /
Statement of responsibility G. Muralidharan, B. Narayanan and C. C. Wong [et al.] --
Title On the Mechanical Properties of a Poly(Oxazolidone) Polymer for Encapsulant Applications /
Statement of responsibility M. Manoharan and K. S. Chian --
Title Thermal Control of Interfaces for Microelectronic Packaging /
Statement of responsibility E. E. Marotta and B. Han --
Title Crack Propagation Experiments on Flip-Chip Solder Joints /
Statement of responsibility S. Wiese, F. Feustel and S. Rzepka [et al.] --
Title Experimental Characterization of Material Properties of 63Sn37Pb Flip Chip Solder Joints /
Statement of responsibility S. Wiese, F. Feustel and S. Rzepka [et al.] --
505 80 - FORMATTED CONTENTS NOTE
Title Fracture Behavior of Epoxy-Based, Hybrid Particulate Composites /
Statement of responsibility M. F. DiBerardino and R. A. Pearson --
Title Optical Probes and Electrical Resistivity Measurements of Conductive Die Attach Adhesives /
Statement of responsibility Joseph Miragliotta, Richard C. Benson and Terry E. Phillips [et al.] --
Title Effect of Humidity on Charge Profiles and Thermal Properties of 1.7 [mu]m Polyimide Films on Silicon Substrates /
Statement of responsibility P. Bloss, A. S. De Reggi and H. Schafer.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Electronic packaging
Form subdivision Congresses.
9 (RLIN) 8859
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Electronic packaging
General subdivision Materials
Form subdivision Congresses.
9 (RLIN) 8860
653 ## - INDEX TERM--UNCONTROLLED
Uncontrolled term მასალები - კონფერენციები
653 ## - INDEX TERM--UNCONTROLLED
Uncontrolled term მასალების შესწავლა - კონფერენციები
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Belton, Daniel James,
Dates associated with a name 1948-
9 (RLIN) 8861
Relator term რედაქტორი
711 2# - ADDED ENTRY--MEETING NAME
Meeting name or jurisdiction name as entry element Symposium on Electronic Packaging Materials Science
Number of part/section/meeting (10th :
Date of meeting 1998 :
Location of meeting San Francisco, Calif.)
9 (RLIN) 8862
900 ## - EQUIVALENCE OR CROSS-REFERENCE-PERSONAL NAME [LOCAL, CANADA]
Numeration TOC
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme Universal Decimal Classification
Item type წიგნი
Holdings
Withdrawn status Lost status Source of classification or shelving scheme Damaged status Not for loan Home library Current library Shelving location Date acquired Total Checkouts Full call number Barcode Date last seen Copy number Price effective from Koha item type
  შესამოწმებელია Universal Decimal Classification     ეროვნული სამეცნიერო ბიბლიოთეკა 1 ეროვნული სამეცნიერო ბიბლიოთეკა 1 საცავი. 1 კორპ. 27.10.2010   620.22(063) 2010-611342 31.08.2011 2E60134 31.08.2011 წიგნი
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