MARC details
| 000 -LEADER |
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| fixed length control field |
02302nam a22002537a 4500 |
| 003 - CONTROL NUMBER IDENTIFIER |
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| control field |
Ge_NSL |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
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| control field |
20240918082325.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
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| fixed length control field |
160323s1985 de ||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
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| International Standard Book Number |
3540151435 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
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| International Standard Book Number |
9783540151432 |
| 041 ## - LANGUAGE CODE |
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| Language code of text/sound track or separate title |
eng |
| 080 ## - UNIVERSAL DECIMAL CLASSIFICATION NUMBER |
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| Universal Decimal Classification number |
53 |
| 245 ## - TITLE STATEMENT |
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| Title |
Polycristalline Semiconductors : |
| Remainder of title |
Physical Properties and Applications : Proceedings of the International School of Materials Science and Technology at the Ettore Majorana Centre, Erice,Italy, July 1-15, 1984 / |
| Statement of responsibility, etc |
Editor G. Harbeke. |
| 264 ## - Production, Publication, Distribution, Manufacture, and Copyright Notice (R) |
|---|
| Place of production, publication, distribution, manufacture (R) |
Berlin : |
| Name of producer, publisher, distributor, manufacturer (R) |
Springer, |
| Date of production, publication, distribution, manufacture, or copyright notice |
1985. |
| 300 ## - PHYSICAL DESCRIPTION |
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| Extent |
viii, 245 p. ; |
| Dimensions |
24 cm. |
| 490 ## - SERIES STATEMENT |
|---|
| სერიის ცნობა |
Springer series in solid-state sciences ; |
| Volume number/sequential designation |
57 |
| 505 ## - FORMATTED CONTENTS NOTE |
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| Formatted contents note |
I Fundamental Aspects of Grain Boundaries.- Atomic Structure of Grain Boundaries. (With 5 Figures).- Computer Calculations of Grain Boundary Energies in Germanium and Silicon. (With 4 Figures).- The Geometrical Character of Extended Interfacial Defects in Semiconducting Materials. (With 12 Figures).- Grain Boundary Segregation. Grain Boundary Diffusion. (With 22 Figures).- II Electronic Characterization of Grain Boundaries.- Electronic Properties of Grain Boundaries. (With 15 Figures).- Electronic States at Grain Boundaries in Semiconductors. (With 15 Figures).- Electrical Properties of Grain Boundaries in the Presence of Deep Bulk Traps. (With 7 Figures).- Beam Induced Current Characterization in Polycrystalline Semiconductors. (With 17 Figures).- III Properties and Applications of Polycrystalline Silicon.- Optical Properties of Polycrystalline Silicon Films. (With 10 Figures).- Polycrystalline Silicon in Integrated Circuits. (With 13 Figures).- IV Applications of Polycrystalline Semiconductor Compounds.- Electroluminescence in Polycrystalline Semiconductors. (With 21 Figures).- The Electrical Properties of Oxides Under Conditions of Oxidation, Reduction and Catalysis.- Evolution of Physical Models for ZnO-Varistors - A Review. (With 18 Figures).- Index of Contributors. |
| 653 ## - INDEX TERM--UNCONTROLLED |
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| Uncontrolled term |
ფიზიკა |
| 653 ## - INDEX TERM--UNCONTROLLED |
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| Uncontrolled term |
ნახევარგამტარები |
| 653 ## - INDEX TERM--UNCONTROLLED |
|---|
| Uncontrolled term |
პოლიკრისტალური ნახევარგამტარები |
| 653 ## - INDEX TERM--UNCONTROLLED |
|---|
| Uncontrolled term |
კრისტალები |
| 700 ## - ADDED ENTRY--PERSONAL NAME |
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| Personal name |
Harbeke, G. |
| Relator term |
რედაქტორი |
| 9 (RLIN) |
302493 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Source of classification or shelving scheme |
Universal Decimal Classification |
| Item type |
წიგნი |