Electron microscopy 1980 : Vol. 3 : Analysis : proceedings of the seventh European congress on electron microscopy including the ninth international conference on X-ray optics and microanalysis, The Hague, The Netherlands, Aug. 24-29, 1980.

Material type: Text

TextLanguage: English Leiden, 1980Description: xxiii, 253 p. : figISBN:

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Item type	Current library	Call number	Copy number	Status	Date due	Barcode
წიგნი	ეროვნული სამეცნიერო ბიბლიოთეკა 1 საცავი. 1 კორპ.	537.533.35 (Browse shelf(Opens below))	3E11988	შესამოწმებელია		2019-26982

Includes bibliogr. references.

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