X-parameters : characterization, modeling, and design of nonlinear RF and microwave components / David E. Root [and three others].
Material type: TextSeries: Cambridge RF and microwave engineering seriesPublisher: Cambridge : Cambridge University Press, 2013Description: 1 online resource (xi, 219 pages) : digital, PDF file(s)Content type:- text
- computer
- online resource
- 9781139042970 (ebook)
- 621.3841/2 23
- TK7876 .R66 2013
Title from publisher's bibliographic system (viewed on 05 Oct 2015).
Machine generated contents note: 1. S-parameters; 2. X-parameters; 3. Small-signal sensitivities in the X-parameters; 4. X-parameter measurements; 5. Multi-tone multi-port X-parameters; 6. Memory.
This is the definitive guide to X-parameters, written by the original inventors and developers of this powerful new paradigm for nonlinear RF and microwave components and systems. Learn how to use X-parameters to overcome intricate problems in nonlinear RF and microwave engineering. The general theory behind X-parameters is carefully and intuitively introduced, and then simplified down to specific, practical cases, providing you with useful approximations that will greatly reduce the complexity of measuring, modeling and designing for nonlinear regimes of operation. Containing real-world case studies, definitions of standard symbols and notation, detailed derivations within the appendices, and exercises with solutions, this is the definitive stand-alone reference for researchers, engineers, scientists and students looking to remain on the cutting-edge of RF and microwave engineering.
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