Microelectronics and reliability : 1987.
Material type:
TextPublication details: Oxford ; New York : Pergamon Press, c1964-Description: v. : ill. ; 26-27 cmISSN: - 0026-2714
- Issues for 1998- have title: Microelectronics reliability
- 621.381/05
- TK7870 .M456
| Item type | Current library | Call number | Vol info | Copy number | Status | Date due | Barcode | |
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პერიოდიკა
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ეროვნული სამეცნიერო ბიბლიოთეკა 1 საცავი. 1 კორპ. | 621.382.8(05) M65 (Browse shelf(Opens below)) | Vol. 27 no. 1-6 (1987) | პ19574 | შესამოწმებელია | 2016-37834 |
Title from cover.
Chemical abstracts 0009-2258
SERBIB/SERLOC merged record
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