Electrically based microstructural characterization II :  symposium held December 1-4, 1997, Boston, Massachusetts, U.S.A. / 
 Electrically based microstructural characterization 2  Electrically based microstructural characterization two 
editors, Rosario A. Gerhardt, Mohammad A. Alim, S. Ray Taylor. 
 -  Materials Research Society,  c1998. 
 - xi, 367 p. :  ill. ;  24 cm. 
 - (Materials Research Society symposium proceedings ; v. 500) .
<br/><br/>Includes bibliographical references and indexes. 
<br/><br/><label>ISBN: </label>155899405X 
<br/><br/><label>LCCN: </label>98045671  
<br/><br/><label>Subjects--Topical Terms: </label><br/>Materials--Microscopy--Congresses.<br/>Microstructure--Congresses.
<br/><br/><label>Subjects--Index Terms: </label>მიკროსტრუქტურა მასალები 
<br/><br/><label>LC Class. No.: </label>TA417.23  / .E416 1998 
<br/><br/><label>Dewey Class. No.: </label>620.1/1299 
<br/><br/><label>Universal Decimal Class. No.: </label>620.22