TY  - SER
TI  - Probe microscopy
SN  - 1355-185X
AV  - QH201 .P76
PY  - 1996///-
CY  - [Amsterdam] Netherlands
PB  - Gordon and Breach Science Publishers
KW  - Microscopy
KW  - Periodicals
KW  - Atomic force microscopy
KW  - Electron microscopy
KW  - Microscopy, Atomic Force
KW  - Microscopy, Electron
N1  - Table of contents and other information about this journal also available through the publisher's web home page site; Title from cover; Periodical; Four issues per volume; Online version of print publication
UR  - http://search.ebscohost.com/direct.asp?db=aph&jid=%22MCY%22&scope=site
ER  -