Reimer, Ludwig,  1928- <br/><br/>
Transmission electron microscopy :  physics of image formation and microanalysis / 
Ludwig Reimer. 
 -  Springer-Verlag,  1984. 
 - xii, 521 p. :  ill. ;  24 cm. 
 - Springer series in optical sciences ;  v. 36 .
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>0387117946 (U.S.) 
<br/><br/><label>LCCN: </label>83014720  
<br/><br/><label>Subjects--Topical Terms: </label><br/>Transmission electron microscopy.
<br/><br/><label>Subjects--Index Terms: </label>ფიზიკა ოპტიკა ელექტრონული მიკროსკოპი 
<br/><br/><label>LC Class. No.: </label>QH212.T7  / R43 1984 
<br/><br/><label>Dewey Class. No.: </label>502/.8/2 
<br/><br/><label>Universal Decimal Class. No.: </label>535