TY - BOOK AU - Ichimiya,Ayahiko AU - Cohen,Philip I. TI - Reflection high-energy electron diffraction SN - 9780511735097 (ebook) AV - QC176.84.S93 I24 2004 U1 - 530.4/275 22 PY - 2004/// CY - Cambridge PB - Cambridge University Press KW - Reflection high energy electron diffraction KW - Thin films KW - Surfaces KW - Analysis N1 - Title from publisher's bibliographic system (viewed on 05 Oct 2015); Historical survey -- Instrumentation -- Wave properties of electrons -- The diffraction conditions -- Geometrical features of the pattern -- Kikuchi and resonance patterns -- Real diffraction patterns -- Electron scattering by atoms -- Kinematic electron diffraction -- Fourier components of the crystal potential -- Dynamical theory : transfer matrix method -- Dynamical theory : embedded R-matrix method -- Dynamical theory : integral method -- Structural analysis of crystal surfaces -- Inelastic scattering in a crystal -- Weakly disordered surfaces -- Strongly disordered surfaces -- RHEED intensity oscillations N2 - Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy, since it is very sensitive to surface structure and morphology. This 2004 book serves as an introduction to RHEED for beginners and describes detailed experimental and theoretical treatments for experts, explaining how to analyze RHEED patterns. For beginners the principles of electron diffraction are explained and many examples of the interpretation of RHEED patterns are described. The second part of the book contains detailed descriptions of RHEED theory. The third part applies RHEED to the determination of surface structures, gives detailed descriptions of the effects of disorder, and critically reviews the mechanisms contributing to RHEED intensity oscillations. This unified and coherent account will appeal to both graduate students and researchers in the study of molecular beam epitaxial growth UR - https://doi.org/10.1017/CBO9780511735097 ER -