TY  - BOOK
AU  - Wallis,T.Mitch
AU  - Kaboš,P.
TI  - Measurement techniques for radio frequency nanoelectronics
T2  - The Cambridge RF and microwave engineering series
SN  - 9781316343098 (ebook)
AV  - TK6552.5 .W35 2017
U1  - 621.3841/30287 23
PY  - 2017///
CY  - Cambridge
PB  - Cambridge University Press
KW  - Radio frequency
KW  - Measurement
KW  - Nanoelectronics
KW  - Radio frequency microelectromechanical systems
N1  - Title from publisher's bibliographic system (viewed on 15 Sep 2017)
N2  - Connect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices and materials.• Learn the techniques needed for characterizing the performance of devices and their constituent building blocks, including semiconducting nanowires, graphene, and other two dimensional materials such as transition metal dichalcogenides• Gain practical insights into instrumentation, including on-wafer measurement platforms and scanning microwave microscopy• Discover how measurement techniques can be applied to solve real-world problems, in areas such as passive and active nanoelectronic devices, semiconductor dopant profiling, subsurface nanoscale tomography, nanoscale magnetic device engineering, and broadband, spatially localized measurements of biological materialsFeaturing numerous practical examples, and written in a concise yet rigorous style, this is the ideal resource for researchers, practicing engineers, and graduate students new to the field of radio frequency nanoelectronics
UR  - https://doi.org/10.1017/9781316343098
ER  -