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Silicon front-end technology--materials processing and modelling / editors, Nicholas E.B. Cowern ... [et al.]. by Series: Materials Research Socisty symposia ; v. 532.
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Warrendale, Pa. : Materials Research Society, c1998
Availability: Items available for loan: ეროვნული სამეცნიერო ბიბლიოთეკა 1 (1)Call number: 678.8.
Wide-bandgap semiconductors for high power, high frequency, and high temperature : symposium held April 13-15, 1998, San Francisco, California, U.S.A. / editors, Stephen DenBaas ... [et al.]. by Series: Materials Research Society symposia proceedings ; v. 512.
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Warrendale, Penn. : Materials Research Society, c1998
Availability: Items available for loan: ეროვნული სამეცნიერო ბიბლიოთეკა 1 (1)Call number: 537.311.322(063).
Semiconductor process and device performance modeling : symposium held December 2-3, 1997, Boston, Massachusetts, U.S.A. / editors, Scott T. Dunham, Jeffrey S. Nelson. by Series: Materials Research Society symposia proceedings ; v. 490.
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Warrendale, Pa. : Materials Research Society, c1998
Availability: Items available for loan: ეროვნული სამეცნიერო ბიბლიოთეკა 1 (1)Call number: 621.38(063).
Infrared applications of semiconductors II : symposium held December 1-4, 1997, Boston, Massachusetts, U.S.A. / editors, Donald L. McDaniel, Jr. ... [et al.]. by Series: Materials Research Society symposia proceedings ; v. 484.
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Pittsburgh, PA : Materials Research Society, 1998
Other title:
  • Infrared applications of semiconductors 2
  • Infrared applications of semiconductors two
Availability: Items available for loan: ეროვნული სამეცნიერო ბიბლიოთეკა 1 (1)Call number: 621.38(063).
Defect and impurity engineered semiconductors II : symposium held April 13-17, 1998, San Francisco, California, U.S.A. / editors, S. Ashok ... [et al.]. by Series: Materials Research Society symposia proceedings ; v. 510.
Material type: Text Text; Format: print ; Literary form: Not fiction
Language: English
Publication details: Warrendale, Pa. : Materials Research Society, c1998
Other title:
  • Defect and impurity engineered semiconductors and devices II
Online resources:
Availability: Items available for loan: ეროვნული სამეცნიერო ბიბლიოთეკა 1 (1)Call number: 621.38.
Defect complexes in semiconductor structures : proceedings of the international school held in Mátrafüred, Hungary, September 13-17, 1982 / edited by J. Giber ... [et al.] ; Magyar Tudományos Akadémia, Műszaki Fizikai Kutató Intézet. by Series: Lecture notes in physics ; 175.
Material type: Text Text; Format: print ; Literary form: Not fiction
Language: English
Publication details: Berlin ; New York : Springer-Verlag, 1983
Availability: Not available: ეროვნული სამეცნიერო ბიბლიოთეკა 1: Lost (1).
Fundamental physics of amorphous semiconductors : proceedings of the Kyoto Summer Institute, Kyoto, Japan, September 8-11, 1980 / editor F. Yonezawa. by Series: Springer series in solid-state sciences ; 25
Material type: Text Text; Format: print ; Literary form: Not fiction
Language: English
Publication details: Berlin ; New York : Springer-Verlag, 1981
Availability: Items available for loan: ეროვნული სამეცნიერო ბიბლიოთეკა 1 (1)Call number: 53.
Materials, technology, and reliability for advanced interconnects and low-k dielectrics : symposium held April 23-27, 2000, San Francisco, California, U.S.A / editors, G.S. Oehrlein ... [et al.]. by Series: Materials Research Society symposia proceedings ; v. 612.
Material type: Text Text
Publication details: Warrendale, Pa. : Materials Research Society, c2001
Availability: Items available for loan: ეროვნული სამეცნიერო ბიბლიოთეკა 1 (1)Call number: 620.22.
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