Transmission electron microscopy : physics of image formation and microanalysis / Ludwig Reimer.

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TextLanguage: English Series: Springer series in optical sciences ; v. 36Publication details: Berlin ; New York : Springer-Verlag, 1984.Description: xii, 521 p. : ill. ; 24 cmISBN:

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Item type	Current library	Call number	Copy number	Status	Date due	Barcode
წიგნი	ეროვნული სამეცნიერო ბიბლიოთეკა 1 საცავი. 1 კორპ.	535 (Browse shelf(Opens below))	2E38596	Available		2016-8493

Includes bibliographical references and index.

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