Intellectual property damages : guidelines and analysis / Mark A. Glick, Lara A. Reymann, Richard Hoffman.
Material type: TextLanguage: English Publication details: Hoboken, N.J. : J. Wiley, c2003.Description: xviii, 483 p. : ill. ; 26 cmISBN:- 0471237191
- 346.7304/8 21
Item type | Current library | Call number | Copy number | Status | Date due | Barcode | |
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წიგნი | ეროვნული სამეცნიერო ბიბლიოთეკა 1 | 347.77 G-53 (Browse shelf(Opens below)) | 3E22744 | შესამოწმებელია | 2010-613018 |
Includes bibliographical references and index.
The litigation process -- Damage principles and Daubert -- Introduction to the economics of intellectual property damage calculations -- Introduction to accounting principles in intellectual property damages -- Financial principles used in intellectual property damages -- Introduction to patent law -- How to calculate patent damages -- Introduction to the antitrust laws -- The intellectual property-antitrust interface -- Introduction to copyright law -- Introduction to trademark law and trade secret law -- Misuse of copyrights, trademarks, and trade secrets -- How to calculate copyright, trademark, and trade secret damages -- The nuts and bolts of intellectual property damage calculation.
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