Contribution à l'étude des défauts réticulaires dans V3Si [VSI] (structure A15) par microscopie électronique / Abdelmottaleb Ben-Lamine.

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Material type: Text

TextLanguage: French Publication details: [S. l.], [S. a.].Description: 240 p. : figSubject(s):

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Holdings
Item type	Current library	Call number	Copy number	Status	Date due	Barcode
წიგნი	ეროვნული სამეცნიერო ბიბლიოთეკა 1 საცავი. 1 კორპ.	535(043) (Browse shelf(Opens below))	3E15326	შესამოწმებელია		2018-8969

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