000 01521nam a22003617a 4500
001 2617489
003 Ge_NSL
005 20230907081201.0
008 980923s1998 paua b 101 0 eng
010 _a 98045671
020 _a155899405X
040 _aDLC
_cDLC
_dDLC
_dDLC
050 0 0 _aTA417.23
_b.E416 1998
080 _a620.22
082 0 0 _a620.1/1299
_221
245 0 0 _aElectrically based microstructural characterization II :
_bsymposium held December 1-4, 1997, Boston, Massachusetts, U.S.A. /
_ceditors, Rosario A. Gerhardt, Mohammad A. Alim, S. Ray Taylor.
246 3 _aElectrically based microstructural characterization 2
246 3 _aElectrically based microstructural characterization two
260 _aWarrendale, Pa. :
_bMaterials Research Society,
_cc1998.
300 _axi, 367 p. :
_bill. ;
_c24 cm.
490 1 _a(Materials Research Society symposium proceedings ; v. 500)
504 _aIncludes bibliographical references and indexes.
650 0 _aMaterials
_xMicroscopy
_xCongresses.
_92801
650 0 _aMicrostructure
_xCongresses.
_92802
653 _aმიკროსტრუქტურა
653 _aმასალები
700 1 _aGerhardt, Rosario A.,
_d1953-
_92803
700 1 _aAlim, Mohammad A.
_92804
700 1 _aTaylor, S. R.
_q(S. Ray),
_d1953-
_92805
906 _a7
_bcbc
_corignew
_d1
_eocip
_f19
_gy-gencatlg
942 _2ddc
_cVM
999 _c1309
_d1309