000			01767nam a22003257a 4500
003			Ge_NSL
005			20230712141310.0
008			111208s1994 de ||||| |||| 00| 0 eng d
010			_a
035			_a(OCoLC)ocm30474665
035			_a(NNC)1526271
040			_aDLC _cDLC _dDLC
041			_aeng
050	0	0	_aQC367 _b.O585 1994
080			_a535
082	0	0	_a530.8 _220
245	0	0	_aOptical measurements : _btechniques and applications / _cFranz Mayinger, editor.
260			_aBerlin ; _aNew York : _bSpringer-Verlag, _cc1994.
300			_axv, 463 p. : _bill. ; _c25 cm.
504			_aIncludes bibliographical references (p. [437]-452) and index.
505	0		_aOptical Probes - Potential and Applicability. 2. Applications and Potential. 3. Introduction to the Schlieren and Shadowgraph Method -- Holography and Holographic Interferometry. 4. Fundamentals of Holography and Interferometry. 5. Holographic Interferometry. 6. Differential Interferometry. 7. Pulsed Laser Holography. 8. Evaluation of holograms by digital image processing -- Techniques Based on Light Scattering. 9. Light Scattering. 10. Laser-Doppler Velocimetry (LDV). 11. Dynamic Light Scattering. 12. Raman Scattering. 13. Laser induced Fluorescence. 14. Absorption -- Light Emission Techniques. 15. Pyrometry and Thermography. 16. Self Fluorescence -- Tomography. 17. Tomographic Measurement and Reconstruction Techniques.
650		0	_aOptical measurements. _93984
650		0	_aOptical measurements _xIndustrial applications. _93985
650		0	_aInterferometry. _93986
653			_aოპტიკური ხელსაწყოები
653			_aინტერფერომეტრი
700	1		_aMayinger, F., _d1931- _93987
942			_2udc _cBK
999			_c1687 _d1687