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020 _a155899520X
040 _aDLC
_cDLC
_dDLC
080 _a620.22
245 0 0 _aMaterials, technology, and reliability for advanced interconnects and low-k dielectrics :
_bsymposium held April 23-27, 2000, San Francisco, California, U.S.A /
_ceditors, G.S. Oehrlein ... [et al.].
260 _aWarrendale, Pa. :
_bMaterials Research Society,
_cc2001.
300 _a1 v. (various pagings) :
_bill. ;
_c24 cm.
490 1 _a(Materials Research Society symposium proceedings ;
_vv. 612)
504 _aIncludes bibliographical references and indexes.
650 0 _aSemiconductors
_xMaterials
_vCongresses.
_98864
650 0 _aSemiconductors
_xJunctions
_vCongresses.
_98865
650 0 _aDielectric films
_vCongresses.
_98866
650 0 _aIntegrated circuits
_xMaterials
_vCongresses.
_98867
650 0 _aIntegrated circuits
_xReliability
_vCongresses.
_98868
700 1 _aOehrlein, G. S.
_98869
830 0 _aMaterials Research Society symposia proceedings ;
_vv. 612.
_98870
906 _a7
_bcbc
_corignew
_d1
_eocip
_f20
_gy-gencatlg
942 _2ddc
_cVM
952 _p2010-611346
_40
_00
_bCPL
_10
_o620.22
_d2010-10-27
_t2E60187
_70
_cGEN
_2udc
_yBK
_aCPL
999 _c3102
_d3102