000			01798nam a22003977a 4500
999			_c494514 _d494512
001			2615951
003			Ge_NSL
005			20190404124106.0
008			190404s1998 us ||||| |||| 00| 0 eng d
010			_a 98029301
020			_a1558994165
040			_aDLC _cDLC _dDLC
041			_aeng
050	0	0	_aTK7871.85 _b.D452 1998
080			_a621.38
082	0	0	_a621.3815/2 _221
245	0	0	_aDefect and impurity engineered semiconductors II : _bsymposium held April 13-17, 1998, San Francisco, California, U.S.A. / _ceditors, S. Ashok ... [et al.].
246	1	4	_aDefect and impurity engineered semiconductors and devices II
260			_aWarrendale, Pa. : _bMaterials Research Society, _cc1998.
300			_axvii, 679 p. : _bill. ; _c24 cm.
490	1		_aMaterials Research Society symposium proceedings ; _vv. 510
504			_aIncludes bibliographical references and indexes.
650		0	_aSemiconductors _xCongresses. _9109704
650		0	_aSemiconductors _xDefects _xCongresses. _9109705
650		0	_aSemiconductors _xImpurity distribution _xCongresses. _98790
653			_aსაინჟინრო საქმე
653			_aზოგადი მანქანათმშენებლობა
653			_aელექტროტექნიკა
653			_aელექტრონიკა
700			_98791 _aAshok, S. _eრედაქტორი
830		0	_aMaterials Research Society symposia proceedings ; _vv. 510. _9109706
856	4	2	_3Publisher description _uhttp://www.loc.gov/catdir/enhancements/fy1108/98029301-d.html
906			_a7 _bcbu _corignew _d1 _eocip _f19 _gy-gencatlg
942			_2udc _cBK