000 02333nam a22003738i 4500
001 CR9780511622533
003 UkCbUP
005 20200124160221.0
006 m|||||o||d||||||||
007 cr||||||||||||
008 090916s1996||||enk o ||1 0|eng|d
020 _a9780511622533 (ebook)
020 _z9780521461962 (hardback)
020 _z9780521024457 (paperback)
040 _aUkCbUP
_beng
_erda
_cUkCbUP
050 0 0 _aQC611.6.D4
_bR43 1996
082 0 0 _a621.3815/2
_220
100 1 _aRedfield, David,
_eauthor.
245 1 0 _aPhotoinduced defects in semiconductors /
_cDavid Redfield and Richard H. Bube.
264 1 _aCambridge :
_bCambridge University Press,
_c1996.
300 _a1 online resource (x, 217 pages) :
_bdigital, PDF file(s).
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
490 1 _aCambridge studies in semiconductor physics and microelectronic engineering ;
_v4
500 _aTitle from publisher's bibliographic system (viewed on 05 Oct 2015).
520 _aThis is the first book to give a complete overview of the properties of deep-level, localized defects in semiconductors. Such comparatively long-lived (or metastable) defects exhibit complex interactions with the surrounding material, and can significantly affect the performance and stability of certain semiconductor devices. After an introductory discussion of metastable defects, the properties of DX and EL2 centres in III-V compounds are presented. Additional crystalline materials are also dealt with, before a detailed description is given of the properties and kinetics of photo-induced defects in amorphous semiconductors. The book closes with an examination of the effects of photo-induced defects in a range of practical applications. Throughout, unifying concepts and models are stressed, and the book will be of great use to graduate students and researchers interested in the physics and materials science of semiconductors.
650 0 _aSemiconductors
_xDefects.
650 0 _aPhotochemistry.
700 1 _aBube, Richard H.,
_d1927-
_eauthor.
776 0 8 _iPrint version:
_z9780521461962
830 0 _aCambridge studies in semiconductor physics and microelectronic engineering ;
_v4.
856 4 0 _uhttps://doi.org/10.1017/CBO9780511622533
999 _c516761
_d516759