000 02383nam a22003858i 4500
001 CR9780511626128
003 UkCbUP
005 20200124160224.0
006 m|||||o||d||||||||
007 cr||||||||||||
008 090916s1997||||enk o ||1 0|eng|d
020 _a9780511626128 (ebook)
020 _z9780521461412 (hardback)
020 _z9780521663656 (paperback)
040 _aUkCbUP
_beng
_erda
_cUkCbUP
050 0 0 _aQC176.8.N35
_bF47 1997
082 0 0 _a537.6/22
_221
100 1 _aFerry, David K.,
_eauthor.
245 1 0 _aTransport in nanostructures /
_cDavid K. Ferry and Stephen M. Goodnick.
264 1 _aCambridge :
_bCambridge University Press,
_c1997.
300 _a1 online resource (xi, 512 pages) :
_bdigital, PDF file(s).
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
490 1 _aCambridge studies in semiconductor physics and microelectronic engineering ;
_v6
500 _aTitle from publisher's bibliographic system (viewed on 05 Oct 2015).
520 _aThis book reviews the results of experimental research into mesoscopic devices, and develops a detailed theoretical framework for understanding their behaviour. The authors begin by discussing the key observable phenomena in nanostructures, including phase interference and weak localization. They then describe quantum confined systems, transmission in nanostructures, quantum dots and single electron phenomena. Separate chapters are devoted to interference in diffusive transport and temperature decay of fluctuations, and the book concludes with a chapter on non-equilibrium transport and nanodevices. Throughout, the authors interweave experimental results with the appropriate theoretical formalism. The book will be of great interest to graduate students taking courses in mesoscopic physics or nanoelectronics, as well as to anyone working on semiconductor nanostructures or the development of new ultrasmall devices.
650 0 _aNanostructures.
650 0 _aMesoscopic phenomena (Physics)
650 0 _aSolid state electronics.
700 1 _aGoodnick, Stephen M.
_q(Stephen Marshall),
_d1955-
_eauthor.
776 0 8 _iPrint version:
_z9780521461412
830 0 _aCambridge studies in semiconductor physics and microelectronic engineering ;
_v6.
856 4 0 _uhttps://doi.org/10.1017/CBO9780511626128
999 _c517051
_d517049