000 02505nam a22003978i 4500
001 CR9780511525261
003 UkCbUP
005 20200124160241.0
006 m|||||o||d||||||||
007 cr||||||||||||
008 090406s1998||||enk o ||1 0|eng|d
020 _a9780511525261 (ebook)
020 _z9780521352222 (hardback)
020 _z9780521017534 (paperback)
040 _aUkCbUP
_beng
_erda
_cUkCbUP
050 0 0 _aQD381.9.S97
_bB75 1998
082 0 0 _a547.7046
_221
100 1 _aBriggs, D.
_q(David),
_d1948-
_eauthor.
245 1 0 _aSurface analysis of polymers by XPS and static SIMS /
_cD. Briggs.
246 3 _aSurface Analysis of Polymers by XPS & Static SIMS
264 1 _aCambridge :
_bCambridge University Press,
_c1998.
300 _a1 online resource (xiv, 198 pages) :
_bdigital, PDF file(s).
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
490 1 _aCambridge solid state science series
500 _aTitle from publisher's bibliographic system (viewed on 05 Oct 2015).
505 0 0 _gCh. 1.
_tIntroduction --
_gCh. 2.
_tXPS --
_gCh. 3.
_tInformation from polymer XPS --
_gCh. 4.
_tStatic SIMS (SSIMS) --
_gCh. 5.
_tInformation from SSIMS --
_gCh. 6.
_tPolymer surface analysis case studies.
520 _aThis book provides an in-depth treatment of the instrumentation, physical bases and applications of X-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) with a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving. In this book, the techniques of XPS and SSIMS are described and in each case the author explains what type of information may be obtained. The book also includes details of case studies emphasising the complementary and joint application of XPS and SSIMS in the investigation of polymer surface structure and its relationship to the properties of the material. This book will be of value to academic and industrial researchers interested in polymer surfaces and surface analysis.
650 0 _aPolymers
_xSurfaces
_xAnalysis.
650 0 _aX-ray spectroscopy.
650 0 _aSecondary ion mass spectrometry.
776 0 8 _iPrint version:
_z9780521352222
830 0 _aCambridge solid state science series.
856 4 0 _uhttps://doi.org/10.1017/CBO9780511525261
999 _c518542
_d518540