000			02084nam a22003258i 4500
001			CR9780511816321
003			UkCbUP
005			20200124160258.0
006			m|||||o||d||||||||
007			cr||||||||||||
008			141103s2003||||enk o ||1 0|eng|d
020			_a9780511816321 (ebook)
020			_z9780521773560 (hardback)
040			_aUkCbUP _beng _erda _cUkCbUP
050	0	0	_aTK7874.65 _b.J43 2003
082	0	0	_a621.381548 _221
100	1		_aJha, Niraj K., _eauthor.
245	1	0	_aTesting of digital systems / _cN.K. Jha and S. Gupta.
264		1	_aCambridge : _bCambridge University Press, _c2003.
300			_a1 online resource (xvi, 1000 pages) : _bdigital, PDF file(s).
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_aonline resource _bcr _2rdacarrier
500			_aTitle from publisher's bibliographic system (viewed on 05 Oct 2015).
520			_aDevice testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
650		0	_aDigital integrated circuits _xTesting.
700	1		_aGupta, S. _q(Sandeep), _d1962- _eauthor.
776	0	8	_iPrint version: _z9780521773560
856	4	0	_uhttps://doi.org/10.1017/CBO9780511816321
999			_c520104 _d520102