000			02173nam a22003618i 4500
001			CR9780511525254
003			UkCbUP
005			20200124160329.0
006			m|||||o||d||||||||
007			cr||||||||||||
008			090406s1996||||enk o ||1 0|eng|d
020			_a9780511525254 (ebook)
020			_z9780521482660 (hardback)
020			_z9780521017954 (paperback)
040			_aUkCbUP _beng _erda _cUkCbUP
050	0	0	_aTA417.23 _b.W36 1996
082	0	0	_a620/.44 _220
100	1		_aWang, Zhong Lin, _eauthor.
245	1	0	_aReflection electron microscopy and spectroscopy for surface analysis / _cZhong Lin Wang.
246	3		_aReflection Electron Microscopy & Spectroscopy for Surface Analysis
264		1	_aCambridge : _bCambridge University Press, _c1996.
300			_a1 online resource (xix, 436 pages) : _bdigital, PDF file(s).
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_aonline resource _bcr _2rdacarrier
500			_aTitle from publisher's bibliographic system (viewed on 05 Oct 2015).
520			_aIn this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature.
650		0	_aMaterials _xMicroscopy.
650		0	_aSurfaces (Technology) _xAnalysis.
650		0	_aReflection electron microscopy.
776	0	8	_iPrint version: _z9780521482660
856	4	0	_uhttps://doi.org/10.1017/CBO9780511525254
999			_c522383 _d522381