000			02560nam a22003738i 4500
001			CR9781316343098
003			UkCbUP
005			20200124160346.0
006			m|||||o||d||||||||
007			cr||||||||||||
008			150209s2017||||enk o ||1 0|eng|d
020			_a9781316343098 (ebook)
020			_z9781107120686 (hardback)
040			_aUkCbUP _beng _erda _cUkCbUP
050	0	0	_aTK6552.5 _b.W35 2017
082	0	0	_a621.3841/30287 _223
100	1		_aWallis, T. Mitch, _d1974- _eauthor.
245	1	0	_aMeasurement techniques for radio frequency nanoelectronics / _cT. Mitch Wallis, National Institute of Standards and Technology, Boulder, Pavel Kabos, National Institute of Standards and Technology, Boulder.
264		1	_aCambridge : _bCambridge University Press, _c2017.
300			_a1 online resource (xiv, 314 pages) : _bdigital, PDF file(s).
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_aonline resource _bcr _2rdacarrier
490	1		_aThe Cambridge RF and microwave engineering series
500			_aTitle from publisher's bibliographic system (viewed on 15 Sep 2017).
520			_aConnect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices and materials.• Learn the techniques needed for characterizing the performance of devices and their constituent building blocks, including semiconducting nanowires, graphene, and other two dimensional materials such as transition metal dichalcogenides• Gain practical insights into instrumentation, including on-wafer measurement platforms and scanning microwave microscopy• Discover how measurement techniques can be applied to solve real-world problems, in areas such as passive and active nanoelectronic devices, semiconductor dopant profiling, subsurface nanoscale tomography, nanoscale magnetic device engineering, and broadband, spatially localized measurements of biological materialsFeaturing numerous practical examples, and written in a concise yet rigorous style, this is the ideal resource for researchers, practicing engineers, and graduate students new to the field of radio frequency nanoelectronics.
650		0	_aRadio frequency _xMeasurement.
650		0	_aNanoelectronics.
650		0	_aRadio frequency microelectromechanical systems.
700	1		_aKaboš, P. _q(Pavel) _eauthor.
776	0	8	_iPrint version: _z9781107120686
830		0	_aCambridge RF and microwave engineering series.
856	4	0	_uhttps://doi.org/10.1017/9781316343098
999			_c523916 _d523914