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005 20150315092011.0
008 111201s1984 de ||||| |||| 00| 0 eng d
020 _a3540133593
020 _a0387133593
041 0 7 _aeng
_2ISO 639-2
080 _a530.1+549
100 1 _aWaseda, Yoshio
_914336
245 0 0 _aNovel application of anomalous (resonance) X-ray scattering for structural characterization of disordered materials /
_cYoshio Waseda.
260 _aBerlin [u.a.] :
_bSpringer,
_c1984.
300 _aVI, 183 S.
490 0 _a(Lecture notes in physics ;
_v204)
_915599
900 _b188;FU02856522
_b83;BV000268793
_b11;BV000268793
942 _2udc
_cBK
952 _p2011-2492
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_bCPL
_10
_o530.1+549
_d2011-05-23
_t2E39646
_70
_cGEN
_2udc
_yBK
_aCPL
999 _c5605
_d5605