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Secondary ion mass spectrometry. SIMS IV : proceedings of the fourth International Conference, Osaka, Japan, November 13 - 19, 1983 Ed. : A. Benninghoven ... by Series: Springer series in chemical physics / Springer series in chemical physics ; 36
Material type: Text Text
Language: English
Publication details: Berlin [u.a.] : Springer, 1984
Availability: Items available for loan: ეროვნული სამეცნიერო ბიბლიოთეკა 1 (1)Call number: 541.1.
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Secondary ion mass spectrometry SIMS III : proceedings of the third International Conference, Budapest, Hungary, August 30 - September 5,1981 Ed. A. Benninghoven ... by Series: Springer series in chemical physics / Springer series in chemical physics ; 19
Material type: Text Text
Language: English
Publication details: Berlin [u.a.] : Springer, 1982
Availability: Items available for loan: ეროვნული სამეცნიერო ბიბლიოთეკა 1 (1)Call number: 541.1.
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Place hold Log in to add tags Add to cart
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