Superfast Fronts of Impact Ionization in Initially Unbiased Layered Semiconductor : Raport MAS-ROI 10 July 2001 / Modelling, Analysis and Simmulation /
Superfast Fronts of Impact Ionization in Initially Unbiased Layered Semiconductor : Raport MAS-ROI 10 July 2001 / Modelling, Analysis and Simmulation /
Structures P. B. Rodin.
- Amsterdam : S.a., 2001.
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