Secondary ion mass spectrometry, SIMS-II : proceedings of the 2nd (second) international conference : Stanford university, Stanford California USA, August 27-31, 1979 : Vol. 2 / ed. by A. Benninghoven ... [et al.].
Material type:
TextBerlin [etc.] : Springer-Verlag, 1979Subject(s):
| Item type | Current library | Call number | Copy number | Status | Date due | Barcode | |
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წიგნი
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ეროვნული სამეცნიერო ბიბლიოთეკა 1 საცავი. 1 კორპ. | 2E37889 | შესამოწმებელია | 2024-86221368 |
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